Materials Science and Engineering

Scanning Transmission Electron Microscopy: Imaging and Analysis

Co-editor: Stephen J. Pennycook
Scanning transmission electron microscopy (STEM) has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of this book are widely credited with bringing the field to its present popularity. The book provides a comprehensive explanation of the theory and practice

Bin Hu

Recognizing Bin Hu for his discoveries in the area of electrical and optical properties of new polymeric materials.